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[IEEE 2017 IEEE International Ultrasonics Symposium (IUS) - Washington, DC, USA (2017.9.6-2017.9.9)] 2017 IEEE International Ultrasonics Symposium (IUS) - Analysis of focused ultrasound with microbubbles induced BBB disruption on tight junction morphology
Kugelman, Tara, Acosta, Camilo, Wang, Shutao, Karakatsani, Marilena, Agalliu, Dritan, Konofagou, ElisaYear:
2017
Language:
english
DOI:
10.1109/ultsym.2017.8091571
File:
PDF, 62 KB
english, 2017