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[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - On the ESD behavior of AlGaN/GaN schottky diodes and trap assisted failure mechanism
Shankar, Bhawani, Sengupta, Rudrarup, Gupta, Sayak Dutta, Soni, Ankit, Mohan, Nagaboopathy, Bhat, Navakanta, Raghavan, Srinivasan, Shrivastava, MayankYear:
2017
Language:
english
DOI:
10.23919/EOSESD.2017.8073423
File:
PDF, 1.12 MB
english, 2017