Multilayer Thin Films as Pseudo-Homogeneous EDX Standards

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

Multilayer Thin Films as Pseudo-Homogeneous EDX Standards

Colijn, Hendrik O., Orsborn, Jonathan, Chmielewski, Daniel, McComb, David W.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927615008983
Date:
August, 2015
File:
PDF, 318 KB
english, 2015
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