[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Design and analysis of LDMOS_SCR with narrow windows
Jin, Xiang-Liang, Zheng, Yi-Fei, Wang, Yang, Zhou, Zi-JieYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060163
File:
PDF, 275 KB
english, 2017