[IEEE 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Pittsburgh, PA, USA (2017.7.25-2017.7.28)] 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Assessment of Si/SiGe PMOS Schottky contacts through atomistic tight binding simulations: Can we achieve the 10 −9 Ω·cm? target?
Sarangapani, Prasad, Weber, Cory, Chang, Jiwon, Cea, Stephen, Golizadeh-Mojarad, Roksana, Povolotskyi, Michael, Klimeck, Gerhard, Kubis, TillmannYear:
2017
Language:
english
DOI:
10.1109/nano.2017.8117314
File:
PDF, 222 KB
english, 2017