Soft X-ray characterization of ion beam sputtered magnesium...

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Surface and Interface Analysis 2018 / 05

Soft X-ray characterization of ion beam sputtered magnesium oxide (MgO) thin film

Sinha, Mangalika, Gupta, Mukul, Jonnard, Philippe, Modi, Mohammed H.
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Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6446
Date:
May, 2018
File:
PDF, 1.33 MB
english, 2018
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