[IEEE 2016 IEEE Applied Imagery Pattern Recognition...

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[IEEE 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2016.10.18-2016.10.20)] 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - A multiple view stereo benchmark for satellite imagery

Bosch, Marc, Kurtz, Zachary, Hagstrom, Shea, Brown, Myron
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Year:
2016
Language:
english
DOI:
10.1109/AIPR.2016.8010543
File:
PDF, 2.57 MB
english, 2016
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