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[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - Face morphing versus face averaging: Vulnerability and detection
Raghavendra, R., Raja, KiranB., Venkatesh, Sushma, Busch, ChristophYear:
2017
Language:
english
DOI:
10.1109/BTAS.2017.8272742
File:
PDF, 1.01 MB
english, 2017