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[IEEE 2017 IEEE Conference on Control Technology and Applications (CCTA) - Mauna Lani Resort, HI, USA (2017.8.27-2017.8.30)] 2017 IEEE Conference on Control Technology and Applications (CCTA) - Capacity fade estimation using supervised learning
Pyne, Moinak, Yurkovich, Benjamin J., Yurkovich, StephenYear:
2017
Language:
english
DOI:
10.1109/CCTA.2017.8062569
File:
PDF, 429 KB
english, 2017