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[IEEE 2017 IEEE Industry Applications Society Annual Meeting - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Industry Applications Society Annual Meeting - Instrumentation and data acquisition for dynamic testing of ground support
Sunderman, Carl, Richardson, Jerald, Raffaldi, MichaelYear:
2017
Language:
english
DOI:
10.1109/IAS.2017.8101842
File:
PDF, 1.29 MB
english, 2017