[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Impact of temperature on the amplitude of RTN fluctuations in 3-D NAND flash cells
Nicosia, G., Mannara, A., Resnati, D., Paolucci, G. M., Tessariol, P., Lacaita, A. L., Spinelli, A. S., Goda, A., Compagnoni, C. MonzioYear:
2017
Language:
english
DOI:
10.1109/IEDM.2017.8268434
File:
PDF, 381 KB
english, 2017