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[IEEE 2017 20th International Multi-topic Conference (INMIC) - Lahore (2017.11.24-2017.11.26)] 2017 International Multi-topic Conference (INMIC) - Multitone measurement system for linearity investigations of microwave devices
Chaudhary, Muhammad Akmal, Memon, Zulfiqar Ali, Lees, Jonathan, Benedikt, Johannes, Tasker, PaulYear:
2017
Language:
english
DOI:
10.1109/INMIC.2017.8289455
File:
PDF, 474 KB
english, 2017