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[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Robustness in automotive electronics: An industrial overview of major concerns
Backhausen, Ulrich, Bailan, Oscar, Bemardi, Paolo, De Luca, Sergio, Henzler, Julie, Kern, Thomas, Piumatti, Davide, Rabenalt, Thomas, Ramamoorthy, Krishnapriya Chakiat, Sanchez, Ernesto, Sansonetti, AYear:
2017
Language:
english
DOI:
10.1109/IOLTS.2017.8046234
File:
PDF, 187 KB
english, 2017