[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study on short failure localization approach by newly developed EBAC technique
Fuse, Junichi, Sunaoshi, Takeshi, Nara, Yasuhiko, Kageyama, Akira, Mizuno, TakayukiYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060075
File:
PDF, 365 KB
english, 2017