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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Fast WLR assessment pulsed test optimizations for decisive DOE analysis base on correlation studies with extensive reliability characterization
Chu, T. P., Then, J. W., Su, Eric S. C., Liew, Wilson J. T.Year:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060112
File:
PDF, 375 KB
english, 2017