[IEEE 2017 40th International Spring Seminar on Electronics...

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[IEEE 2017 40th International Spring Seminar on Electronics Technology (ISSE) - Sofia, Bulgaria (2017.5.10-2017.5.14)] 2017 40th International Spring Seminar on Electronics Technology (ISSE) - Limitations of variable shaped electron beam lithography for advanced research and semiconductor applications

Kostic, Ivan, Vutova, Katia, Bencurova, Anna, Ritomsky, Adrian, Andok, Robert
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Year:
2017
Language:
english
DOI:
10.1109/ISSE.2017.8000969
File:
PDF, 2.53 MB
english, 2017
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