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[IEEE 2017 IEEE 2nd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - Chengdu (2017.12.15-2017.12.17)] 2017 IEEE 2nd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) - A detector circuit design for roundness measuring instrument based on the dynamic offset detection
Jin, Kun, He, Yongyi, Liu, ChangYear:
2017
Language:
english
DOI:
10.1109/ITNEC.2017.8284814
File:
PDF, 442 KB
english, 2017