Experimental characterization of the Random Telegraph Noise...

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IEEE Electron Device Letters 2018

Experimental characterization of the Random Telegraph Noise signature in MOSFETs under the influence of magnetic fields

Huerta, Oscar, Marquez, Carlos, Tec-Chim, Adrian I., Guarin, Fernando, Gutierrez-D., Edmundo-A., Gamiz, Francisco
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Year:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2835142
File:
PDF, 4.01 MB
english, 2018
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