[IEEE 2017 IEEE National Aerospace and Electronics Conference (NAECON) - Dayton, OH (2017.6.27-2017.6.30)] 2017 IEEE National Aerospace and Electronics Conference (NAECON) - Embedded silicon odometers for monitoring the aging of high-temperature integrated circuits
Majerus, Steve, Tang, Xinyao, Liang, Jifu, Mandal, SoumyajitYear:
2017
Language:
english
DOI:
10.1109/NAECON.2017.8268752
File:
PDF, 708 KB
english, 2017