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[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Experimental assessment of electron ionization cross sections
Basaglia, T., Bonanomi, M., Cattorini, F., Han, M. C., Hoff, G., Kim, C. H., Kim, S. H., Marcoli, M., Pia, M. G., Ronchieri, E., Saracco, P.Year:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069822
File:
PDF, 99 KB
english, 2016