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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2018

EffiTest2: Efficient Delay Test and Prediction for Post-Silicon Clock Skew Configuration under Process Variations

Zhang, Grace Li, Li, Bing, Shi, Yiyu, Hu, Jiang, Schlichtmann, Ulf
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2018.2818713
File:
PDF, 459 KB
english, 2018
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