A Flexible Scan-in Power Control Method in Logic BIST and...

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IEEE Transactions on Emerging Topics in Computing 2017

A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips

Kato, Takaaki, Wang, Senling, Sato, Yasuo, Kajihara, Seiji, Wen, Xiaoqing
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Emerging Topics in Computing
DOI:
10.1109/TETC.2017.2767070
File:
PDF, 1.59 MB
english, 2017
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