![](/img/cover-not-exists.png)
Study for Phosphorus Contamination to High Voltage Transistors
Li, Liang, Luo, Qiong, Wu, Zeng Yuan, Tan, Yun Ling, See, Alex, Chua, Soo Cheng, Zhu, Troy, Cheng, Chor ShuVolume:
30
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2017.2747592
Date:
November, 2017
File:
PDF, 1.30 MB
english, 2017