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[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Varennes, Quebec, Canada (1973.10.29-1973.10.31)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Breakdown mechanism of extremely thin SiO films

Tsuchida, Nuio, Ueda, M.
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Year:
1973
Language:
english
DOI:
10.1109/eidp.1973.7683911
File:
PDF, 1.47 MB
english, 1973
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