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[IEEE 2017 IEEE International High-Level Design Validation and Test Workshop (HLDVT) - Santa Cruz, CA (2017.10.5-2017.10.6)] 2017 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Automated test generation for post silicon microcontroller validation
Moharikar, Pankaj, Guddeti, JayakrishnaYear:
2017
Language:
english
DOI:
10.1109/hldvt.2017.8167462
File:
PDF, 1.09 MB
english, 2017