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[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - On the frequency dependence of oxide trap coupling in nanoscale MOSFETs: Understanding based on complete 4-state trap model
Peng Hao,, Mao, Dongyuan, Runsheng Wang,, Shaofeng Guo,, Ren, Pengpeng, Ru Huang,Year:
2016
Language:
english
DOI:
10.1109/icsict.2016.7998625
File:
PDF, 2.37 MB
english, 2016