[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Novel electrostatic discharge (ESD) clamp circuit with low leakage current
Liang, Wei, Yang, Zhaonian, Li, Hang, Dong, Aihua, Sundaram, Kalpathy B., Liou, Juin J.Year:
2017
Language:
english
DOI:
10.1109/ipfa.2017.8060091
File:
PDF, 178 KB
english, 2017