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[IEEE 1986 IEEE International Symposium on Electromagnetic Compatibility - SAN DIEGO, CA (1986.9.16-1986.9.18)] 1986 IEEE International Symposium on Electromagnetic Compatibility - Surveillance Testing Ensures EMP Hardness of Military Systems
Buckman, Thomas W., Knighten, James L., Stewart, Richard W., Trippe, Anthony P.Year:
1986
Language:
english
DOI:
10.1109/isemc.1986.7568293
File:
PDF, 577 KB
english, 1986