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[IEEE 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Pittsburgh, PA, USA (2017.7.25-2017.7.28)] 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - A simple implementation of scanning tunneling potentiometry with a standard scanning tunneling microscope
Xie, Ting, Dreyer, Michael, Bowen, David, Hinkel, Dan, Butera, R. E., Kraffit, Charles, Mayergoyz, IsaakYear:
2017
Language:
english
DOI:
10.1109/nano.2017.8117420
File:
PDF, 259 KB
english, 2017