[IEEE 2017 IEEE Optical Interconnects Conference (OI) - Santa Fe, NM, USA (2017.6.5-2017.6.7)] 2017 IEEE Optical Interconnects Conference (OI) - Characterization of systematic process variation in a silicon photonic platform
Boynton, Nicholas, Pomerene, Andrew, Starbuck, Andrew, Lentine, Anthony, DeRose, Christopher T.Year:
2017
Language:
english
DOI:
10.1109/oic.2017.7965506
File:
PDF, 188 KB
english, 2017