[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics...

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[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Theoretical investigation of backgate-biasing effects on ultrathin-body GeSn based tunneling FET

Wang, Hongjuan, Han, Genquan, Liu, Yan, Zhang, Jincheng, Hao, Yue, Jiang, Xiangwei
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Year:
2017
Language:
english
DOI:
10.1109/s3s.2017.8309214
File:
PDF, 933 KB
english, 2017
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