Study on the Impacts of Hole Injection and Inclusion of...

  • Main
  • 2017
  • Study on the Impacts of Hole Injection and Inclusion of...

Study on the Impacts of Hole Injection and Inclusion of Sub-oxide and Metallic Si Atoms on Repeatable Resistance Switching of Sputter-Deposited Silicon Oxide Films

Omura, Yasuhisa, Yamaguchi, Rintaro, Sato, Shingo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2017.2756260
File:
PDF, 612 KB
english, 2017
Conversion to is in progress
Conversion to is failed