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Study on the Impacts of Hole Injection and Inclusion of Sub-oxide and Metallic Si Atoms on Repeatable Resistance Switching of Sputter-Deposited Silicon Oxide Films
Omura, Yasuhisa, Yamaguchi, Rintaro, Sato, ShingoYear:
2017
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2017.2756260
File:
PDF, 612 KB
english, 2017