SiGe HBT Profiles With Enhanced Inverse-Mode Operation and...

IEEE Transactions on Nuclear Science 2018 / 1 Vol. 65; Iss. 1

SiGe HBT Profiles With Enhanced Inverse-Mode Operation and Their Impact on Single-Event Transients

Fleetwood, Zachary E., Ildefonso, Adrian, Tzintzarov, George N., Wier, Brian, Raghunathan, Uppili, Cho, Moon-Kyu, Song, Ickhyun, Wachter, Mason T., Nergui, Delgermaa, Khachatrian, Ani, Warner, Jeffrey
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2017.2782183
Date:
January, 2018
File:
PDF, 2.82 MB
english, 2018
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