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[IEEE 2017 IEEE International Ultrasonics Symposium (IUS) - Washington, DC, USA (2017.9.6-2017.9.9)] 2017 IEEE International Ultrasonics Symposium (IUS) - Long term reliability test results of CMUT
Zhao, Danhua, Simopoulos, Costas, Zhuang, SteveYear:
2017
Language:
english
DOI:
10.1109/ultsym.2017.8091952
File:
PDF, 52 KB
english, 2017