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[IEEE 2017 IEEE International Ultrasonics Symposium (IUS) - Washington, DC (2017.9.6-2017.9.9)] 2017 IEEE International Ultrasonics Symposium (IUS) - Traveling wave excitation for FEM simulation of RF SAW/BAW devices
Li, Xinyi, Bao, Jingfu, Huang, Yulin, Zhang, Benfeng, Omori, Tatsuya, Hashimoto, Ken-yaYear:
2017
Language:
english
DOI:
10.1109/ultsym.2017.8092218
File:
PDF, 70 KB
english, 2017