(Invited) Current Status and Trends in RF...

ECS Transactions 2018 / 04 Vol. 85; Iss. 8

(Invited) Current Status and Trends in RF Silicon-on-Insulator Material and Device

Raskin, Jean-Pierre
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
85
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/08508.0047ecst
Date:
April, 2018
File:
PDF, 616 KB
english, 2018
Conversion to is in progress
Conversion to is failed