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Purely electronic nanometallic resistance switching random-access memory
Lu, Yang, Yoon, Jung Ho, Dong, Yanhao, Chen, I.-WeiVolume:
43
Language:
english
Journal:
MRS Bulletin
DOI:
10.1557/mrs.2018.91
Date:
May, 2018
File:
PDF, 1.33 MB
english, 2018