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ChemInform Abstract: STRUCTURE OF MANGANESE-SILICON MELTS BY MEANS OF X-RAY DIFFRACTION
NASSIF, E., LAMPARTER, P., SEDELMEYER, B., STEEB, S.Volume:
15
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.198402006
Date:
January, 1984
File:
PDF, 109 KB
1984