[IEEE 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Aging precursors and degradation effects of SiC-MOSFET modules under highly accelerated power cycling conditions
Luo, Haoze, Iannuzzo, Francesco, Blaabjerg, Frede, Turnaturi, Marcello, Mattiuzzo, EmilioYear:
2017
Language:
english
DOI:
10.1109/ECCE.2017.8096478
File:
PDF, 762 KB
english, 2017