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[IEEE 2017 IEEE International Conference on Electro Information Technology (EIT) - Lincoln, NE, USA (2017.5.14-2017.5.17)] 2017 IEEE International Conference on Electro Information Technology (EIT) - Modeling and analysis of stacked depletion-mode NMOS transistors for RF switch applications
Ning, Runtao, Liu, Tianjiao, Wang, Wendi, Shen, Z. JohnYear:
2017
Language:
english
DOI:
10.1109/EIT.2017.8053326
File:
PDF, 1.01 MB
english, 2017