[IEEE 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA, USA (2017.10.15-2017.10.18)] 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - EMI radiation physics using generalized characteristic mode (GCM) analysis with loss for practical structures
Cao, Ying S., Wang, Xu, Wang, Yansheng, Jiang, Lijun, Ruehli, Albert E., He, Shiquan, Zhao, Huapeng, Hu, Jun, Fan, Jun, Drewniak, James. L.Year:
2017
Language:
english
DOI:
10.1109/EPEPS.2017.8329764
File:
PDF, 168 KB
english, 2017