[IEEE 2017 IEEE International Conference on Mechatronics and Automation (ICMA) - Takamatsu, Japan (2017.8.6-2017.8.9)] 2017 IEEE International Conference on Mechatronics and Automation (ICMA) - Crack like defect characterization based on the scattering coefficient distribution using ultrasonic arrays
Meng, Tao, Yao, Benchun, Wang, Deguo, Jiao, JingpinYear:
2017
Language:
english
DOI:
10.1109/ICMA.2017.8015959
File:
PDF, 1012 KB
english, 2017