[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A prolonged discharge time ESD power-rail clamp circuit structure with strong ability to prevent false triggering
Cao, Jian, Xiangxiang Xue,, Wang, Yuan, Lu, Guangyi, Zhang, XingYear:
2016
Language:
english
DOI:
10.1109/ICSICT.2016.7998718
File:
PDF, 5.61 MB
english, 2016