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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Analysis of clamped inductive turn-off failure of multi-finger lateral IGBT in SOI single chip inverter ICs
Huang, Xuequan, Zhao, Minna, Wang, Hao, Zhu, Jing, Zhang, Long, Sun, Weifeng, Ding, Desheng, Gu, Yan, Zhang, SenYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060203
File:
PDF, 431 KB
english, 2017