![](/img/cover-not-exists.png)
[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - A methodology for short term and long term NBTI prediction under any bias conditions
Zhang, Hanyu, Ma, Chenyue, Wu, Xuezhong, Lin, XinnanYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060212
File:
PDF, 477 KB
english, 2017