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[IEEE 2017 New York Scientific Data Summit (NYSDS) - New York, NY, USA (2017.8.6-2017.8.9)] 2017 New York Scientific Data Summit (NYSDS) - Automated X-ray diffraction of irradiated materials
Rodman, John, Lin, Yuewei, Sprouster, David, Ecker, Lynne, Yoo, ShinjaeYear:
2017
Language:
english
DOI:
10.1109/NYSDS.2017.8085053
File:
PDF, 681 KB
english, 2017