Dynamic Scanning Electromagnetic Infrared Thermographic...

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Dynamic Scanning Electromagnetic Infrared Thermographic Analysis Based on Blind Source Separation for Industrial Metallic Damage Evaluation

He, Yunze, Yang, Ruizhen, Wu, Xuan, Huang, Shoudao
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/TII.2018.2822293
File:
PDF, 1.18 MB
english, 2018
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