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[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Random discrete dopant induced variability in negative capacitance transistors
Dutta, Tapas, Georgiev, Vihar, Asenov, AsenYear:
2018
Language:
english
DOI:
10.1109/ULIS.2018.8354732
File:
PDF, 1.29 MB
english, 2018