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[IEEE 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA (2017.10.15-2017.10.18)] 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Mixed epistemic-aleatory uncertainty quantification using reduced dimensional polynomial chaos and parametric ANOVA
Prasad, Aditi K., Roy, SourajeetYear:
2017
Language:
english
DOI:
10.1109/epeps.2017.8329716
File:
PDF, 284 KB
english, 2017