[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Reliability projecting for ReRAM based on stochastic differential equation
Wei, Zhiqiang, Eriguchi, Koji, Muraoka, Shunsaku, Katayama, Koji, Yasuhara, Ryotaro, Ken, Kawai, Hayakawa, Yukio, Shimakawa, Kazuhiko, Mikawa, Takumi, Shinichi, YonedaYear:
2016
Language:
english
DOI:
10.1109/icsict.2016.7998872
File:
PDF, 796 KB
english, 2016